Teseq NSG 3040 Burst Generator 4kV
Description
Teseq NSG 3040 Burst Generator 4 kV multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards.
The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.
Features
- Modular, expandable system
- Surge, EFT/Burst, Power Quality and more
- Intuitive 7.2” color touch screen interface
- Expert mode for changing parameters while test is running (diagnostics)
- Status LEDs
- Safety connectors
Specifications
Combination wave pulse 1, 2/50 – 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
Parameter | Value |
Pulse voltage (open circuit) | ±200 V to 4.4 kV (in 1 V steps) |
Pulse current (short circuit) | ±100 A to 2.2 kA |
Impedance | 2/12 Ω |
Polarity | positive / negative / alternate |
Pulse repetition | 10 s, up to 600 s (in 1 s steps) |
Test duration | 1 to 9999 pulses, continuous |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Coupling | external / internal |
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter | Value |
Pulse amplitude | ±200 V to 4.8 kV (in 1 V steps) – open circuit ±100 V to 2.4 kV (50 Ω matching system) |
Burst frequency | 100 Hz to 1000 kHz |
Polarity | positive / negative / alternate |
Repetition time | 1 ms to 4200 s (70 min) |
Burst time | 1 μs to 1999 s, single pulse, continuous |
Test duration | 1 s to 1000 h |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Coupling | external / internal |
Dips & drops
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter | Value |
Dips & drops | From EUT voltage input to 0 V, 0% |
Uvar with optional variac | depending on model (VAR 650x) |
Uvar with step transformer | 0, 40, 70, 80% (INA 650x) |
Peak inrush current capability | 500 A (at 230 V) |
Switching times | 1 to 5 μs (100 Ω load) |
Event time | 20 μs to 1999 s, 1 to 99’999 cycles |
Test duration | 1 s to 70’000 min, 1 to 99’999 events, continuous |
Repetition time | 40 μs to 35 min, 1 to 99’999 cycles |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
- ANSI/IEEE Standards
- ANSI/IEEE C62.41
- Basic Standards
- IEC 61000-4-11
- IEC 61000-4-29
- IEC 61000-4-4
- IEC 61000-4-5
- IEC 61000-4-8
- IEC 61000-4-9
- Telecom Standards
- ITU-T K.12
- ITU-T K.20
- ITU-T K.21
- ITU-T K.28
- ITU-T K.41
- ITU-T K.44
- ITU-T K.45
- Product Standards
- EN 300 386 V1.3.2
- EN 300 386-2 V1.1.3
- EN 50082-1
- EN 50082-2
- EN 50370-1
- EN 61643
- IEC 60255-1
- IEC 60601-1-2
- IEC 61326-1
- IEC 61850-3
- EN 301 489-1
- EN 301 489-17
- EN 301 489-24
- EN 301 489-7
- Automotive Standards
- Generic Standards
- EN 61000-6-1
- EN 61000-6-2
- Automotive OEM Specifications
- UNECE R10 (Automotive)