Teseq NSG 3060 Burst Generator 6kV
Description
Teseq NSG 3060 Burst Generator System 6 kV Solution is a multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards.
The NSG 3060 system is designed to fulfill conducted EMC test requirements for CE mark testing and ANSI C62.41, including Combination Wave Surge (6.6 kV), Electrical Fast Transient (EFT) pulses (4.8 kV), Ring Wave (6.6 kV), and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.
Features
- Modular, expandable system
- Surge, EFT/Burst, Power Quality, Ring Wave, and more
- Surge voltage up to 6.6 kV for overtesting
- ANSI and IEC coupling methods
- Intuitive 7.2” color touch screen interface
- Expert mode for changing parameters while test is running (diagnostics)
- Status LEDs
- Safety connectors
Specifications
Combination wave pulse 1, 2/50 – 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5 and ANSI (IEEE) 62.41
Parameter | Value |
Pulse voltage (open circuit) | ±200 V to 6.6 kV (in 1 V steps) |
Pulse current (short circuit) | ±100 A to 3.3 kA |
Impedance | 2/12 Ω |
Polarity | positive / negative / alternate |
Pulse repetition | 5* to 20 s, up to 600 s (in 1 s steps) * derated depending on selected pulse voltage and EUT supply voltage |
Test duration | 1 to 9999 pulses, continuous |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Coupling | ANSI / IEC / external |
Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Parameter | Value |
Pulse amplitude | ±200 V to 4.8 kV (in 1 V steps) – open circuit ±100 V to 2.4 kV (50 Ω matching system) |
Burst frequency | 100 Hz to 1000 kHz |
Polarity | positive / negative / alternate |
Repetition time | 1 ms to 4200 s (70 min) |
Burst time | 1 μs to 1999 s, single pulse, continuous |
Test duration | 1 s to 1000 h |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Coupling | ANSI / IEC / external |
Dips & drops
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
Parameter | Value |
Dips & drops | From EUT voltage input to 0 V, 0% |
Uvar with optional variac | depending on model (VAR 650x) |
Uvar with step transformer | 0, 40, 70, 80% (INA 650x) |
Peak inrush current capability | 500 A (at 230 V) |
Switching times | 1 to 5 μs (100 Ω load) |
Event time | 20 μs to 1999 s, 1 to 99’999 cycles |
Test duration | 1 s to 70’000 min, 1 to 99’999 events, continuous |
Repetition time | 40 μs to 35 min, 1 to 99’999 cycles |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Ringwave 0.5 μs/100 kHz
Pulse conforms to IEC/EN 61000-4-12 and ANSI (IEEE) C62.41
Parameter | Value |
Pulse voltage (open circuit) | ± 200 V to 6.6 kV (in 1 V steps) |
Pulse current (short circuit) | ±16.6 to ±550 A, ±10% ±6.6 to ±220 A, ±10% ±1 to ±33 A, ±10% |
Impedance | 12/30/200 Ω |
Polarity | positive / negative / alternate |
Pulse repetition | 5* to 20 s, up to 600 s (in 1 s steps) * derated depending on selected pulse voltage and EUT supply voltage |
Test duration | 1 to 9999 pulses, continuous |
Phase synchronization | asynchronous, synchronous 0 to 359º (in 1º steps) |
Coupling | ANSI / IEC / external |
- ANSI/IEEE Standards
- ANSI/IEEE C62.41
- Basic Standards
- IEC 61000-4-11
- IEC 61000-4-12
- IEC 61000-4-29
- IEC 61000-4-4
- IEC 61000-4-5
- IEC 61000-4-8
- IEC 61000-4-9
- Telecom Standards
- ITU-T K.12
- ITU-T K.20
- ITU-T K.21
- ITU-T K.28
- ITU-T K.41
- ITU-T K.44
- ITU-T K.45
- Product Standards
- EN 300 386 V1.3.2
- EN 300 386-2 V1.1.3
- EN 50082-1
- EN 50082-2
- EN 50370-1
- EN 61643
- FCC 97-270 (Part 68)
- IEC 60255-1
- IEC 60601-1-2
- IEC 61009-1
- IEC 61326-1
- IEC 61850-3
- EN 301 489-1
- EN 301 489-17
- EN 301 489-24
- EN 301 489-7
- Automotive Standards
- Generic Standards
- EN 61000-6-1
- EN 61000-6-2
- Automotive OEM Specifications
- UNECE R10 (Automotive)